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Absolute measurement of detector quantum efficiency using parametric downconversion.

J G Rarity, K D Ridley, P R Tapster

|June 5, 2010

Summary

A novel method uses photon pairs from parametric downconversion to measure detector quantum efficiency. This technique was used to assess silicon avalanche photodiodes, offering a new standard for quantum detection system calibration.

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Quantum State Engineering of Light with Continuous-wave Optical Parametric Oscillators

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Area of Science:

Quantum Optics
Photonics
Metrology

Background:

Accurate measurement of quantum detection system efficiency is crucial for quantum technologies.
Conventional methods for measuring quantum efficiency can be complex and time-consuming.

Purpose of the Study:

To demonstrate a new method for absolute quantum efficiency measurement using photon pairs.
To evaluate the quantum efficiency of silicon avalanche photodiodes (Si APDs) using this novel technique.

Main Methods:

Utilized a parametric downconversion crystal to generate angle-resolved coincident photon pairs.
Employed the generated photon pairs to measure the absolute quantum efficiency of a photon counting detection system.
Measured the quantum efficiency of a silicon avalanche photodiode (Si APD) operated in Geiger mode.

Main Results:

Successfully measured the absolute quantum efficiency of the Si APD.
Investigated the dependence of quantum efficiency on the operating voltage of the Si APD.
Compared the results obtained with the novel method to those from a conventional method.

Conclusions:

Parametric downconversion provides a viable and accurate method for absolute quantum efficiency determination.
The developed technique offers a valuable tool for calibrating and characterizing photon counting systems.
Results provide insights into the performance of Si APDs as a function of operating voltage.