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Updated: Jun 12, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

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Surface studies of heterogeneous catalysts by time-of-flight secondary ion mass spectrometry

Jacek Grams1

  • 1Institute of General and Ecological Chemistry, Technical University of Lodz, ul. Zeromskiego 116, Lodz, Poland. jgrams@p.lodz.pl

European Journal of Mass Spectrometry (Chichester, England)
|June 10, 2010
PubMed

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