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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

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Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jun 12, 2026

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
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In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation

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Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a

F E Christensen, A Hornstrup, H W Schnopper

    Applied Optics
    |June 10, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study investigates mirrored surface roughness using x-ray scattering. Analysis reveals microroughness across a wide spatial wavelength bandwidth, crucial for x-ray optics performance.

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    Last Updated: Jun 12, 2026

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    11:27

    Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

    Published on: December 8, 2016

    Area of Science:

    • Materials Science
    • Optics
    • Surface Science

    Background:

    • X-ray programs require precise characterization of mirrored surfaces.
    • Surface roughness impacts optical performance across various spatial scales.
    • Existing measurement methods are bandwidth-limited, necessitating careful analysis.

    Purpose of the Study:

    • To investigate mirrored surface roughness over a wide spatial wavelength bandwidth.
    • To analyze the surface autocorrelation function within specified bandwidth limitations.
    • To provide evidence for microroughness in mirrored surfaces.

    Main Methods:

    • Scattering measurements using a triple-axis perfect-crystal x-ray diffractometer.
    • Autocorrelation function analysis of surface data.
    • Measurement of integrated reflectivity.

    Main Results:

    • Detailed surface roughness characterization from large-scale figure error to micro roughness.
    • Determination of the surface autocorrelation function within the measurement bandwidth.
    • Evidence of microroughness in the range of angstroms to tens of microns.

    Conclusions:

    • Accurate specification of bandwidth limitations is critical for surface roughness analysis.
    • X-ray scattering measurements effectively characterize microroughness in mirrored surfaces.
    • The findings are vital for optimizing performance in x-ray optics and related applications.