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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Related Experiment Video

Updated: Jun 12, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Published on: October 11, 2016

Analysis of the interference pattern in a cross-grating interferometer.

Y S Cheng

    Applied Optics
    |June 10, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study demonstrates how to control interference fringe localization in a four-beam cross-grating interferometer. Different light sources and beam path lengths enable fringe localization at various planes, offering versatile optical applications.

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    Last Updated: Jun 12, 2026

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    Area of Science:

    • Optics and Photonics
    • Interferometry
    • Diffraction Gratings

    Background:

    • Interference fringes in interferometers typically localize at specific planes.
    • Controlling fringe localization is crucial for advanced optical applications.

    Purpose of the Study:

    • To investigate methods for controlling the localization plane of interference fringes in a four-beam cross-grating interferometer.
    • To explore the effects of different light sources and beam configurations on fringe localization.

    Main Methods:

    • Utilizing a structured light source to illuminate a four-beam cross-grating interferometer.
    • Employing monochromatic spatially incoherent light to image amplitude transmittance.
    • Using white light extended source illumination with four beams of equal path length.

    Main Results:

    • Interference fringes were successfully localized at different planes by manipulating the illumination source and beam paths.
    • Monochromatic spatially incoherent light allowed imaging of grating transmittance to various locations.
    • White light illumination enabled the formation of cross-grating patterns both on and off the optical axis.

    Conclusions:

    • The four-beam cross-grating interferometer offers tunable fringe localization.
    • The choice of light source and beam geometry significantly impacts fringe behavior.
    • The study provides insights into designing advanced interferometric systems.