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Related Concept Videos

Interference: Path Lengths01:10

Interference: Path Lengths

Consider two sources of sound, that may or may not be in phase, emitting waves at a single frequency, and consider the frequencies to be the same.
Two special sources may be considered when they are in phase. This can be easily achieved by feeding the two sources from the same source. An example would be synchronizing the two speakers by feeding them with the same source, such as the sound waves produced by a tuning fork. This setup ensures that the two sources have the same frequency and are...
Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences01:20

Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences

Inductively coupled plasma–mass spectrometry (ICP–MS) is a highly selective and sensitive technique for accurate elemental analysis. Though the analysis of ICP–MS mass spectra is comparatively straightforward, it is affected by spectroscopic and non-spectroscopic interferences. Spectroscopic interferences arise when the plasma contains ionic species with an m/z value the same as the analyte ion. Spectroscopic interference can be categorized as isobaric, polyatomic ions, and refractory oxide ion...
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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Effect of spurious reflection on phase shift interferometry.

C Ai, J C Wyant

    Applied Optics
    |June 10, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study presents a practical algorithm to eliminate phase errors caused by spurious reflections in Twyman-Green and Fizeau interferometers, comparing its effectiveness against two other methods.

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    Area of Science:

    • Optics
    • Optical Metrology
    • Interferometry

    Background:

    • Spurious reflections in Twyman-Green and Fizeau interferometers introduce significant phase errors.
    • Accurate phase measurements are critical in optical testing and metrology.

    Purpose of the Study:

    • To investigate phase errors arising from spurious reflections in Twyman-Green and Fizeau interferometers.
    • To develop and evaluate a practical algorithm for effectively eliminating these phase errors.
    • To compare the performance of the proposed algorithm with existing methods.

    Main Methods:

    • Analysis of phase error mechanisms in Twyman-Green and Fizeau interferometers.
    • Development of a novel algorithm for phase error correction.
    • Comparative evaluation of three distinct algorithms using simulated or experimental data.

    Main Results:

    • The presented algorithm effectively eliminates phase errors caused by spurious reflections.
    • Quantitative comparison demonstrates the superiority or comparable performance of the new algorithm.
    • Identified limitations and advantages of each algorithm under specific conditions.

    Conclusions:

    • The proposed algorithm offers a practical and effective solution for mitigating phase errors in interferometric measurements.
    • Accurate phase error correction is essential for reliable optical surface characterization.
    • Further research may explore the algorithm's application in more complex interferometric setups.