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Anomalies in integrating sphere measurements on structured samples
Applied Optics
|June 12, 2010
Summary
Structured samples measured with a double-beam integrating sphere show reflectance anomalies. Sample structure and sphere imperfections cause erroneous readings up to 50% due to confined diffuse reflectance and port losses.
Area of Science:
- Optical physics
- Materials science
- Spectroscopy
Background:
- Accurate reflectance measurements are crucial for characterizing materials.
- Integrating spheres are standard tools for measuring total and diffuse reflectance.
- Structured samples can present unique challenges in optical measurements.
Purpose of the Study:
- To investigate anomalies in reflectance measurements of structured samples using a double-beam integrating sphere.
- To identify the causes of these reflectance anomalies.
- To quantify the potential deviations in measured values.
Main Methods:
- Utilized a double-beam integrating sphere setup.
- Performed reflectance measurements on structured samples.
- Analyzed the interplay between sample structure and sphere geometry.
Main Results:
- Observed significant anomalies in total and diffuse reflectance values.
- Demonstrated that sample structure and sphere imperfections are the primary causes.
- Found that confined diffuse reflectance leads to port losses and erroneously high signals.
- Quantified deviations in reflectance values up to 50%.
Conclusions:
- Reflectance anomalies in structured samples measured with integrating spheres are significant.
- Geometric imperfections of the sphere and sample structure interact to cause measurement errors.
- Careful consideration of sample structure and sphere geometry is necessary for accurate reflectance determination.
