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Related Concept Videos

NMR Spectrometers: Resolution and Error Correction01:14

NMR Spectrometers: Resolution and Error Correction

When magnetic nuclei in a sample achieve resonance and undergo relaxation, the signal detected in NMR is an approximately exponential free induction decay. Fourier transform of an exponential decay yields a Lorentzian peak in the frequency domain. Lorentzian peaks in an NMR spectrum are defined by their amplitude, full width at half maximum, and position, where the peak width is governed by the spin-spin relaxation time alone. In real experiments, however, the applied magnetic field is rendered...

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Related Experiment Video

Updated: Jun 12, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Published on: June 19, 2018

Anomalies in integrating sphere measurements on structured samples.

A Roos, C G Ribbing, M Bergkvist

    Applied Optics
    |June 12, 2010
    PubMed
    Summary

    Structured samples measured with a double-beam integrating sphere show reflectance anomalies. Sample structure and sphere imperfections cause erroneous readings up to 50% due to confined diffuse reflectance and port losses.

    Area of Science:

    • Optical physics
    • Materials science
    • Spectroscopy

    Background:

    • Accurate reflectance measurements are crucial for characterizing materials.
    • Integrating spheres are standard tools for measuring total and diffuse reflectance.
    • Structured samples can present unique challenges in optical measurements.

    Purpose of the Study:

    • To investigate anomalies in reflectance measurements of structured samples using a double-beam integrating sphere.
    • To identify the causes of these reflectance anomalies.
    • To quantify the potential deviations in measured values.

    Main Methods:

    • Utilized a double-beam integrating sphere setup.
    • Performed reflectance measurements on structured samples.
    • Analyzed the interplay between sample structure and sphere geometry.

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    Main Results:

    • Observed significant anomalies in total and diffuse reflectance values.
    • Demonstrated that sample structure and sphere imperfections are the primary causes.
    • Found that confined diffuse reflectance leads to port losses and erroneously high signals.
    • Quantified deviations in reflectance values up to 50%.

    Conclusions:

    • Reflectance anomalies in structured samples measured with integrating spheres are significant.
    • Geometric imperfections of the sphere and sample structure interact to cause measurement errors.
    • Careful consideration of sample structure and sphere geometry is necessary for accurate reflectance determination.