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Sinusoidal phase modulating interferometer using optical fibers for displacement measurement.

O Sasaki, K Takahashi

    Applied Optics
    |June 12, 2010
    PubMed
    Summary
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    We developed a simple sinusoidal phase modulating (SPM) interferometer using optical fiber for accurate displacement measurement. This system achieves high precision, measuring movements and surface profiles in the nanometer range.

    Area of Science:

    • Optics and Photonics
    • Metrology and Measurement Science
    • Materials Science and Engineering

    Background:

    • Accurate displacement measurement is crucial in various scientific and industrial applications.
    • Traditional interferometers can be complex and sensitive to environmental factors.
    • The need for compact and robust displacement sensors persists.

    Purpose of the Study:

    • To propose and demonstrate a novel sinusoidal phase modulating (SPM) interferometer.
    • To achieve high-accuracy displacement measurements using a simplified optical configuration.
    • To validate the system's performance on dynamic movements and surface profiling.

    Main Methods:

    • Development of an SPM interferometer utilizing an optical fiber for phase modulation.

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    Last Updated: Jun 12, 2026

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  • Signal processing of the detected optical signal using a microcomputer.
  • Experimental validation using a piezoelectric transducer for dynamic displacement and a diamond-turned disk for surface profiling.

    • Main Results:

    • The SPM interferometer demonstrated a simple optical configuration.
    • High-accuracy displacement measurements in the nanometer range were achieved.
    • Successful measurement of piezoelectric transducer movements and aluminum disk surface profiles.

    Conclusions:

    • The proposed SPM interferometer offers a practical and accurate solution for displacement metrology.
    • The use of optical fiber simplifies the system and enhances its applicability.
    • The technology shows potential for precise measurement in diverse fields.