You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 12, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
A novel optical pipelined architecture for binary arithmetic units is introduced. This design overcomes geometrical limitations, enabling efficient microminiaturization for advanced computing applications.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: