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Bulk heterojunction polymer memory devices with reduced graphene oxide as electrodes
Juqing Liu1, Zongyou Yin, Xiehong Cao
1Key Laboratory for Organic Electronics & Information Displays (KLOEID) and Institute of Advanced Materials (IAM), Nanjing University of Posts and Telecommunications, 9 Wenyuan Road, Nanjing 210046, China.
Researchers developed a novel polymer memory device using reduced graphene oxide (rGO) and P3HT:PCBM. This device exhibits a write-once-read-many-times (WORM) effect with a high ON/OFF ratio and low switching voltage.
Area of Science:
- Materials Science
- Electrical Engineering
- Nanotechnology
Background:
- Polymer-based nonvolatile memory devices are crucial for flexible electronics.
- Developing efficient and stable memory devices with high performance is an ongoing challenge.
- Reduced graphene oxide (rGO) offers promising properties as an electrode material.
Purpose of the Study:
- To design and fabricate a novel polymer nonvolatile memory device structure.
- To investigate the electrical characteristics and memory effect of the fabricated device.
- To understand the carrier transport mechanisms and propose an explanation for the observed electrical transition.
Main Methods:
- Fabrication of a memory device with a unique structure: reduced graphene oxide (rGO) /P3HT:PCBM/Al.
- Characterization of the device's current-voltage (I-V) properties.
- Analysis of carrier transport mechanisms in different memory states.
Main Results:
- The device demonstrated electrical bistability with a write-once-read-many-times (WORM) memory effect.
- Achieved a high ON/OFF ratio (10^4-10^5) and a low switching threshold voltage (0.5-1.2 V).
- Identified thermionic emission current and ohmic current as dominant transport mechanisms in OFF and ON states, respectively.
Conclusions:
- The rGO/P3HT:PCBM/Al device structure is effective for polymer nonvolatile memory applications.
- The memory performance is influenced by the sheet resistance of the rGO electrode.
- Polarization of PCBM domains and localized internal electrical fields explain the device's electrical transition.
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