Generic gamma correction for accuracy enhancement in fringe-projection profilometry

Thang Hoang1, Bing Pan, Dung Nguyen

  • 1Department of Electrical Engineering, The Catholic University of America, Washington, DC 20064, USA.

Optics Letters
|June 16, 2010
PubMed
Summary

This study presents a simple method to improve 3D shape measurement accuracy by correcting gamma-induced intensity nonlinearity in fringe-projection profilometry. The technique enhances measurement precision for 3D object scanning.