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Updated: Jun 12, 2026

11:10
Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
Published on: May 23, 2018
Characterization of vanadium oxide optical thin films by x-ray diffractometry
Applied Optics
|June 16, 2010
Abstract:
Thin-film x-ray diffractometry with Seemann-Bohlin focusing provides enhanced sensitivity to the microstructures of optical thin films. Results on vanadium oxide films are presented.
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