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Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
UV–Vis Spectroscopy: Woodward–Fieser Rules01:29

UV–Vis Spectroscopy: Woodward–Fieser Rules

UV–Visible absorption spectra of conjugated dienes arise from the lowest energy π → π* transitions. The light-absorbing part of the molecule is called the chromophore, and the substituents directly attached to the chromophore are called auxochromes. A strong correlation exists between the absorption maxima, λmax, and the structure of a conjugated π system. The Woodward–Fieser rules predict the value of λmax for a given structure by adding the contributions...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...

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Optical properties of vanadium dioxide and vanadium pentoxide thin films.

Applied optics·2010
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Related Experiment Video

Updated: Jun 12, 2026

Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
11:10

Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model

Published on: May 23, 2018

Characterization of vanadium oxide optical thin films by x-ray diffractometry.

E E Chain

    Applied Optics
    |June 16, 2010
    PubMed
    Summary

    Seemann-Bohlin focusing in thin-film X-ray diffractometry enhances microstructure analysis of optical thin films. This method offers improved sensitivity for characterizing materials like vanadium oxide films.

    Area of Science:

    • Materials Science
    • Condensed Matter Physics
    • Crystallography

    Background:

    • Optical thin films are crucial in various technologies.
    • Characterizing the microstructure of thin films is essential for performance.
    • Traditional methods may lack sensitivity for subtle microstructural features.

    Purpose of the Study:

    • To demonstrate the enhanced sensitivity of Seemann-Bohlin focusing for thin-film X-ray diffractometry.
    • To investigate the microstructures of optical thin films using this advanced technique.
    • To present specific results for vanadium oxide thin films.

    Main Methods:

    • Utilized thin-film X-ray diffractometry (XRD).
    • Employed Seemann-Bohlin (SB) focusing geometry.
    • Applied the technique to analyze vanadium oxide (VOx) thin films.

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    Aerosol-assisted Chemical Vapor Deposition of Metal Oxide Structures: Zinc Oxide Rods
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    Aerosol-assisted Chemical Vapor Deposition of Metal Oxide Structures: Zinc Oxide Rods

    Published on: September 14, 2017

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    Last Updated: Jun 12, 2026

    Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
    11:10

    Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model

    Published on: May 23, 2018

    In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
    09:49

    In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx

    Published on: May 13, 2020

    Aerosol-assisted Chemical Vapor Deposition of Metal Oxide Structures: Zinc Oxide Rods
    06:39

    Aerosol-assisted Chemical Vapor Deposition of Metal Oxide Structures: Zinc Oxide Rods

    Published on: September 14, 2017

    Main Results:

    • Seemann-Bohlin focusing significantly improved the sensitivity to microstructural variations.
    • Detailed microstructural information was obtained from the vanadium oxide films.
    • The technique effectively probed film texture and crystallite size.

    Conclusions:

    • Seemann-Bohlin focused thin-film XRD is a powerful tool for microstructure analysis.
    • This method provides superior insights into optical thin film properties.
    • Vanadium oxide films exhibit distinct microstructural characteristics amenable to this analysis.