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Scattering And Absorption of Light in Planetary Regoliths
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Constrained eigenfunction method for the inversion of remote sensing data: application to particle size determination

B P Curry

    Applied Optics
    |June 16, 2010
    PubMed
    Summary

    This study presents a new deconvolution method to determine particle size distribution from light scattering data. The technique uses constrained expansion and iterative refinement for accurate results.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Computational Physics

    Background:

    • Light scattering analysis is crucial for characterizing particle size distributions.
    • Fredholm integral equations are often used to model scattering phenomena.
    • Accurate inversion of scattering data is challenging due to inherent errors.

    Purpose of the Study:

    • To develop and validate a novel deconvolution method for determining particle size distribution from light scattering data.
    • To invert Fredholm equations representing light scattering by dielectric spheres.
    • To provide an alternative to existing constrained linear inversion techniques.

    Main Methods:

    • Utilized a constrained expansion in Schmidt-Hilbert eigenfunctions for deconvolution.

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  • Employed a minimization of squared residual errors with trial function constraints.
  • Implemented a doubly iterative approach for the inversion process.
  • Compared the method with the Phillips-Twomey technique.

    • Main Results:

    • Successfully inverted Fredholm equations to retrieve particle size distributions.
    • Demonstrated the method's robustness with test deconvolutions containing various error levels.
    • The proposed method shows dualistic properties to Phillips-Twomey for constrained linear inversion.

    Conclusions:

    • The developed deconvolution method accurately determines particle size distribution from scattering data.
    • The technique offers a robust alternative for solving Fredholm equations in the presence of errors.
    • This approach enhances the analysis of light scattering for material characterization.