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Updated: Jun 12, 2026

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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Thickness and refractive index dispersion measurement in a thin film using the Haidinger interferometer
Applied Optics
|June 16, 2010
Abstract:
A Haidinger interferometer setup was adapted for accurate measurement of thickness and refractive index dispersion in transparent films using some spectral lines of a commercial argon-ion laser. Experimental results are reported and compared with those from other available methods.
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