Raman scattering temperature probe of laser disk marking.

Area of Science:

• Materials Science
• Optics
• Spectroscopy

Background:

• Optical data storage relies on material property changes induced by lasers.
• Accurate temperature measurement is crucial for understanding and optimizing laser-induced marking processes in dye/polymer systems.
• Non-contact, in-situ temperature monitoring methods are needed for real-time analysis.

Purpose of the Study:

• To directly measure laser-induced temperature rise in dye/polymer systems used for optical storage.
• To validate a novel temperature measurement technique based on Raman scattering.
• To investigate temperature distribution during laser writing below and at the marking threshold.

Main Methods:

• Utilized the intensity ratio of anti-Stokes to Stokes Raman scattered radiations for temperature determination.
• Employed the writing laser beam itself for collecting Raman scattering data, enabling in-situ measurements.
• Developed computer simulations of laser-induced temperature distribution and corresponding intensity ratios to extract accurate temperature values.

Main Results:

• Successfully obtained direct measurements of laser-induced temperature rise in the dye/polymer system.
• Demonstrated that the Raman scattering intensity ratio correlates directly with the temperature developed on the recording films.
• Characterized temperature profiles at various laser powers, including those below the marking threshold.

Conclusions:

• The anti-Stokes/Stokes Raman scattering intensity ratio is a viable and direct method for measuring laser-induced temperatures in dye/polymer optical storage media.
• This technique allows for precise temperature determination during the laser writing process, crucial for optimizing optical storage performance.
• The findings provide a foundation for developing more controlled and efficient laser-based data recording technologies.