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Updated: Jun 12, 2026

Thermal Measurement Techniques in Analytical Microfluidic Devices
Published on: June 3, 2015
Seid Sadat1, Aaron Tan, Yi Jie Chua
1Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA.
This study introduces an atomic force microscope (AFM) technique for high-resolution temperature mapping in metallic films. The method achieves 10 mK temperature resolution and <100 nm spatial resolution for nanoscale thermal analysis.
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