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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
Echo01:06

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Reflection of Waves01:07

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When a wave travels from one medium to another, it gets reflected at the boundary of the second medium. A common example of this is when a person yells at a distance from a cliff and hears the echo of their voice. The sound waves (longitudinal waves) traveling in the air are reflected from the bounding cliff. Similarly, flipping one end of a string whose other end is tied to a wall causes a pulse (transverse wave) to travel through the string, which gets reflected upon reaching the wall. In...
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Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
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Related Experiment Video

Updated: Jun 12, 2026

An Experimental Protocol for Femtosecond NIR/UV - XUV Pump-Probe Experiments with Free-Electron Lasers
09:49

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Published on: October 23, 2018

Temporal delay of a pulse undergoing frustrated total internal reflection.

A Ghatak, S Banerjee

    Applied Optics
    |June 18, 2010
    PubMed
    Summary

    Wave packet transit time through a second medium during frustrated total internal reflection becomes independent of thickness beyond a specific point. These findings are crucial for understanding quantum tunneling and optical phenomena.

    Area of Science:

    • Physics
    • Quantum Mechanics
    • Optics

    Background:

    • Frustrated total internal reflection (FTIR) is a phenomenon where light or wave packets can penetrate a barrier even when the angle of incidence exceeds the critical angle.
    • Understanding the dynamics of wave packet propagation in such scenarios is essential for various applications in optics and quantum mechanics.

    Purpose of the Study:

    • To investigate the relationship between the thickness of the second medium and the wave packet transit time during frustrated total internal reflection.
    • To determine if there is a critical thickness beyond which the transit time remains constant.

    Main Methods:

    • Utilized calculations based on the theory of frustrated total internal reflection.
    • Analyzed the behavior of wave packets as they interact with a second medium of varying thickness.

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    Last Updated: Jun 12, 2026

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    Main Results:

    • Calculations demonstrated that the wave packet transit time is dependent on the thickness of the second medium up to a certain threshold.
    • Beyond this critical thickness, the transit time was found to be independent of the second medium's thickness.

    Conclusions:

    • The thickness of the second medium in FTIR does not indefinitely influence wave packet transit time.
    • A saturation effect in transit time is observed, indicating a limit to the medium's influence on wave packet propagation dynamics.