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Silver-magnesium fluoride cermet films. 1: Preparation and microstructure.

M Gajdardziska-Josifovska, R C McPhedran, D J Cockayne

    Applied Optics
    |June 18, 2010
    PubMed
    Summary

    This study shows silver-magnesium fluoride thin films can contain many voids. Film structure depends on composition, thickness, and substrate, impacting void content.

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    Area of Science:

    • Materials Science
    • Thin Film Technology
    • Surface Science

    Background:

    • Thin films are crucial in various technological applications.
    • Understanding void formation in mixed thin films is key to controlling their properties.
    • Silver-magnesium fluoride (Ag-MgF2) is a promising material system for optical and electronic applications.

    Purpose of the Study:

    • To investigate the void volume fraction in Ag-MgF2 thin films.
    • To correlate film composition with void content.
    • To analyze the microstructural evolution of these films.

    Main Methods:

    • Preparation of seventeen thin films with varying Ag-MgF2 compositions.
    • Measurement of mass thickness using quartz crystal oscillators.
    • Determination of physical thickness via stylus profilometry.

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  • Analysis of film microstructure using electron microscopy.

    • Main Results:

    • Quantified void volume fraction as a function of film composition.
    • Demonstrated that the Ag-MgF2 system can incorporate a high void volume fraction.
    • Observed that film microstructure is dependent on composition, thickness, and substrate.

    Conclusions:

    • The Ag-MgF2 system offers significant potential for creating porous thin films.
    • Film microstructure and void content are controllable through composition, thickness, and substrate selection.
    • These findings are relevant for optimizing thin film performance in various applications.