Related Experiment Video
Updated: Jun 12, 2026

Applications of Spatio-temporal Mapping and Particle Analysis Techniques to Quantify Intracellular Ca2+ Signaling In Situ
Published on: January 7, 2019
Merit functions for more effective thin film calculations
Abstract:
This paper reviews the different types of merit functions that have been used in the past in optical thin film calculations. Attention is drawn to the power of merit functions which operate on complicated quantities that require one or more integral expressions for their definition. To prove this point, several thin film problems are solved in which the CIE coordinates, luminous transmittances or reflectances, solar absorptance, and blackbody emittances of a multilayer are specified.
Related Concept Videos
Singularity Functions for Shear
Deflection of a Beam
Singularity functions, described in an earlier lesson, are powerful mathematical tools that represent discontinuities within a function commonly encountered in structural loading...
Mechanistic Models: Compartment Models in Algorithms for Numerical Problem Solving
In individual population analyses, different algorithms are employed, such as Cauchy's method, which uses a...
Estimation of the Physical Quantities
Introduction to Functions
Lagrange Multipliers: Two Constraints