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Updated: Jun 12, 2026

09:32
Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Abstract:
Many-layer dielectric film systems can be reduced to groups of three layers by a simple method. This replacement is exact for one wavelength, but only approximate for other wavelengths. Still it turns out to be very useful when reducing the number of layers in the flip-flop design.
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