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Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
Determination of optical constants by angle scanning reflectometry
Applied Optics
|June 18, 2010
Abstract:
Reflectance measurements made on an Fe film over a wide range of angles of incidence are curve-fitted to extract the optical constants n and k. Problems with surface oxide layers are eliminated by making the reflectance measurements through the substrate. The experimental uncertainties of n and k are determined by a rigorous x(2) analysis. The experimentally determined optical constants are found to be considerably larger than values found in the literature.
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