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Updated: Jun 12, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Analytical derivation of the structure of carrier lifetime and its nonlinear dependence on optical field intensity in

G Chiaretti, D Reichenbach, C Vaccarino

    Applied Optics
    |June 18, 2010
    PubMed

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