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Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Related Experiment Video

Updated: Jun 12, 2026

High-resolution Episcopic Microscopy (HREM) - Simple and Robust Protocols for Processing and Visualizing Organic Materials
08:52

High-resolution Episcopic Microscopy (HREM) - Simple and Robust Protocols for Processing and Visualizing Organic Materials

Published on: July 7, 2017

High resolution measurement of multilayer structures.

T M Merklein

    Applied Optics
    |June 18, 2010
    PubMed
    Summary

    This study introduces a method using Müller fringes for precise thickness measurement of single and multilayer structures, achieving nanometer resolution for thin films and atomic-level precision for thicker samples.

    Area of Science:

    • Optical Physics
    • Materials Science
    • Metrology

    Background:

    • Accurate thickness measurement is crucial for material characterization.
    • Existing methods may lack resolution for nanoscale or multilayer structures.

    Purpose of the Study:

    • To present an interferometric method for measuring thin film and multilayer thickness.
    • To demonstrate nanometer and sub-atomic layer resolution.

    Main Methods:

    • Utilizing a fringes-of-equal-chromatic-order interferometric system.
    • Employing Müller fringes, which represent the power spectrum of surfaces.
    • Expanding the technique for multilayer analysis.

    Main Results:

    • Achieved nanometer resolution for single-layer thickness measurement.

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    Last Updated: Jun 12, 2026

    High-resolution Episcopic Microscopy (HREM) - Simple and Robust Protocols for Processing and Visualizing Organic Materials
    08:52

    High-resolution Episcopic Microscopy (HREM) - Simple and Robust Protocols for Processing and Visualizing Organic Materials

    Published on: July 7, 2017

    Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes
    11:19

    Multimodal Hierarchical Imaging of Serial Sections for Finding Specific Cellular Targets within Large Volumes

    Published on: March 20, 2018

    Atomically Traceable Nanostructure Fabrication
    12:35

    Atomically Traceable Nanostructure Fabrication

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  • Extended capability to multilayer structures up to millimeters in total thickness.
  • Demonstrated resolution better than the diameter of an atomic layer for multilayers.

    • Conclusions:

    • The Müller fringes interferometric system offers high-resolution thickness metrology.
    • The method is adaptable for both single and complex multilayer systems.
    • Holographic measurement of power spectra allows for evaluation of the multilayer sequence.