Selective tuning and optimization of the contacts to metallic and semiconducting single-walled carbon nanotubes

Conductance imaging atomic force microscopy was used to probe the electrical interface between single-walled carbon nanotubes and metal electrodes. The contact resistance was optimized by applying a local voltage pulse (approximately 2 s) using a conductive probe with controlled loading force to the region of the metal electrode contacting the nanotube. Using this technique, we show that Pd forms superior contacts, resulting in contact resistance values that are among the lowest ever reported.