Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Dielectric Polarization in a Capacitor

Dielectric Polarization in a Capacitor

The presence of a dielectric medium in a capacitor not only changes the voltage and capacitance but also affects the electric field. In general, dielectrics can be of two types: polar and nonpolar. In a polar dielectric, the positive and negative charges in the molecules are separated by a distance and hence have a permanent dipole moment. In contrast, no such charge separation exists in a nonpolar dielectric, however the nonpolar molecules get polarized in the presence of an external electric...

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

Measuring Reaction Rates

Measuring Reaction Rates

Polarimetry finds application in chemical kinetics to measure the concentration and reaction kinetics of optically active substances during a chemical reaction. Optically active substances have the capability of rotating the plane of polarization of linearly polarized light passing through them—a feature called optical rotation. Optical activity is attributed to the molecular structure of substances. Normal monochromatic light is unpolarized and possesses oscillations of the electrical field in...

Group Polarization

Group Polarization

Group polarization is the strengthening of an original group attitude following the discussion of views within a group (Teger & Pruitt, 1967). That is, if a group initially favors a viewpoint, after discussion the group consensus is likely a stronger endorsement of the viewpoint. Conversely, if the group was initially opposed to a viewpoint, group discussion would likely lead to stronger opposition.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.

Applied optics·2010

Same author

Determination of the optical functions of transparent glasses by using spectroscopic ellipsometry.

Applied optics·2010

Same author

Use of the biased estimator in the interpretation of spectroscopic ellipsometry data.

Applied optics·2010

Same author

High frequency polarization modulation method for measuring birefringence.

Applied optics·2010

Same author

High frequency polarization modulation method for measuring optical rotation.

Applied optics·2010

Same author

Four-channel polarimeter for time-resolved ellipsometry.

Optics letters·2009

Search research articles

Related Experiment Video

Updated: Jun 12, 2026

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements

Published on: February 28, 2016

Two-channel polarization modulation ellipsometer.

G E Jellison, F A Modine

|June 22, 2010

Summary

A novel wavelength-scanning ellipsometer simultaneously measures ellipsometric parameters using a photo-elastic modulator and Wollaston prism. This versatile instrument accurately determines optical functions, demonstrated by silicon measurements.

Area of Science:

Optical Physics
Materials Science
Spectroscopy

Background:

Ellipsometry is a powerful technique for characterizing material optical properties.
Traditional ellipsometers can be complex and time-consuming for full spectral analysis.
Need for advanced instrumentation for rapid and simultaneous optical characterization.

Purpose of the Study:

To introduce a new wavelength-scanning two-channel polarization modulation ellipsometer.
To demonstrate simultaneous determination of all three ellipsometric parameters (N, S, C).
To validate the instrument's versatility by measuring the optical functions of silicon.

Main Methods:

Utilized a photo-elastic modulator for polarization modulation.
Employed a Wollaston prism to separate orthogonally polarized light beams.

More Related Videos

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Published on: September 8, 2023

A Photonic System for Generating Unconditional Polarization-Entangled Photons Based on Multiple Quantum Interference

A Photonic System for Generating Unconditional Polarization-Entangled Photons Based on Multiple Quantum Interference

Published on: September 5, 2019

Related Experiment Videos

Last Updated: Jun 12, 2026

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements

Automation of Mode Locking in a Nonlinear Polarization Rotation Fiber Laser through Output Polarization Measurements

Published on: February 28, 2016

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Published on: September 8, 2023

A Photonic System for Generating Unconditional Polarization-Entangled Photons Based on Multiple Quantum Interference

A Photonic System for Generating Unconditional Polarization-Entangled Photons Based on Multiple Quantum Interference

Published on: September 5, 2019

Implemented dynamically controlled phototube bias voltage and lock-in amplifiers for precise detection.

Main Results:

Achieved simultaneous measurement of N, S, and C in a single scan.
Successfully determined the optical functions of silicon (Si) across a broad spectral range (238-652 nm).
Demonstrated the instrument's capability for efficient and comprehensive optical characterization.

Conclusions:

The developed wavelength-scanning ellipsometer offers a versatile and efficient approach to optical characterization.
Simultaneous acquisition of multiple ellipsometric parameters enhances data collection speed and accuracy.
The instrument is suitable for determining optical functions of various materials over extended spectral ranges.