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Thickness matching in planar multilayer waveguides.

H J Frankena, J Jong, H Oltmans

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    Summary
    This summary is machine-generated.

    A new theoretical method precisely determines dielectric multilayer stack layer thicknesses for a target effective index. This approach also optimizes cover thickness for prism coupling, with experimental results confirming designed values.

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    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Dielectric multilayer stacks are crucial optical components.
    • Precise control over layer thickness is essential for achieving desired optical properties.
    • Existing methods may lack the precision or versatility for complex stack designs.

    Purpose of the Study:

    • To develop a theoretical method for determining individual layer thicknesses in dielectric multilayer stacks.
    • To enable the design of stacks with a prescribed effective index for specific modes.
    • To optimize the cover layer thickness for efficient prism coupling applications.

    Main Methods:

    • A theoretical framework is presented for inverse design of multilayer stacks.
    • The method utilizes given refractive indices and other layer thicknesses to solve for a target thickness.
    • It incorporates principles of optical mode analysis and effective index theory.

    Main Results:

    • The theoretical method successfully determines the thickness of an arbitrary layer.
    • It allows for the calculation of optimal cover thickness for prism coupling.
    • Experimental verification confirmed that the achieved effective indices match the designed values.

    Conclusions:

    • The developed theoretical method provides a robust tool for designing dielectric multilayer stacks.
    • It offers precise control over optical properties like effective index.
    • The method is validated experimentally, demonstrating its practical applicability in optical device fabrication.