Related Experiment Video

Updated: Jun 12, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Experimental verification of parallel processing on a hybrid optical parallel array logic system

J Tanida, J Nakagawa, E Yagyu

    Applied Optics
    |June 23, 2010
    PubMed

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