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Reflectometer for measurements of scattering from photodiodes and other low scattering surfaces
Applied Optics
|June 23, 2010
Abstract:
We have designed and tested a simple instrument to measure the diffuse reflectance of good quality optical surfaces such as the surfaces of semiconductor detectors with uncertainties of ~3%. Measurements have been performed on Si photodiodes and on a sample of known reflectance at two different wavelengths.
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