[High-resolution patch-clamp technique based on feedback control of scanning ion conductance microscopy]

Xi Yang1, Xiao Liu, Xiao-Fan Zhang

  • 1China National Academy of Nanotechnology and Engineering, Tianjin, China.

Summary

This study introduces a high-resolution patch-clamp technique combining scanning ion conductance microscopy (SICM) with patch-clamp recording. The new method precisely targets cellular microstructures, enabling detailed ion channel studies on living cells.