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Related Experiment Video

Updated: Jun 12, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Method for characterizing nanoscale wear of atomic force microscope tips.

Jingjing Liu1, Jacob K Notbohm, Robert W Carpick

  • 1Materials Science Program, Department of Mechanical Engineering, University of Wisconsin, Madison, Wisconsin 53706, USA.

ACS Nano
|June 26, 2010
PubMed
Summary

This study introduces a new method to quantify nanoscale tip wear in atomic force microscopy (AFM) probes. The technique reveals diverse failure mechanisms in silicon and silicon nitride tips, crucial for nanomanufacturing applications.

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Area of Science:

  • Nanotechnology
  • Materials Science
  • Surface Science

Background:

  • Atomic force microscopy (AFM) is vital for nanoscale tribology and nanomanufacturing.
  • Conventional AFM probes (silicon, silicon nitride) suffer from nanoscale wear, limiting their application.
  • Understanding tip wear mechanisms is critical for advancing AFM capabilities.

Purpose of the Study:

  • To develop and demonstrate a systematic method for quantifying nanoscale tip wear in AFM probes.
  • To investigate and characterize the failure mechanisms of different AFM tip materials.
  • To provide a quantitative process for assessing tip degradation during use.

Main Methods:

  • Sequential contact-mode AFM scans on ultrananocrystalline diamond surfaces.
  • Intermittent tip property measurements using blind reconstruction and adhesion force measurements.

Related Experiment Videos

Last Updated: Jun 12, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

  • Tip geometry analysis using transmission electron microscopy (TEM).

    • Main Results:

    • Direct measurement of volume loss and agreement between blind reconstruction and TEM imaging.
    • Monitoring of tip geometries over approximately 100 mm scanning distance.
    • Identification of distinct failure modes: nanoscale fracture (Si), film failure (SiNx-coated Si), and atom-by-atom attrition (SiNx).

    Conclusions:

    • The developed method provides a quantitative and systematic approach to examine AFM tip degradation and nanoscale wear.
    • Experimental results illustrate diverse mechanisms leading to tip failure in different materials.
    • This research is crucial for improving the durability and reliability of AFM probes in nanomanufacturing and tribological studies.