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Updated: Jun 12, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Characterizing voltage contrast in photoelectron emission microscopy

V K Sangwan1, V W Ballarotto, K Siegrist

  • 1Department of Physics, University of Maryland, College Park, Maryland 20742, USA.

Journal of Microscopy
|June 29, 2010
PubMed

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