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Updated: Jun 11, 2026

Measurement of Tension Release During Laser Induced Axon Lesion to Evaluate Axonal Adhesion to the Substrate at Piconewton and Millisecond Resolution
Published on: May 27, 2013
Tohru Suemoto1, Kota Terakawa, Yoshihiro Ochi
1Institute for Solid State Physics, The University of Tokyo, Kashiwa-shi, Chiba, Japan.
Researchers developed a novel soft X-ray laser interferometer for high-resolution surface imaging. This tool achieved nanometer depth sensitivity and picosecond time-resolution, enabling observation of material changes during laser ablation.
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