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Updated: Jun 11, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

High speed carrier-depletion modulators with 1.4V-cm V(pi)L integrated on 0.25microm silicon-on-insulator waveguides

Ning-Ning Feng1, Shirong Liao, Dazeng Feng

  • 1Kotura Inc., 2630 Corporate Place, Monterey Park, CA 91754, USA. nfeng@kotura.com

Optics Express
|July 1, 2010
PubMed

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