X-ray Imaging
Phase Contrast and Differential Interference Contrast Microscopy
Super-resolution Fluorescence Microscopy
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Updated: Jun 11, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Zhifeng Huang1, Zhiqiang Chen, Li Zhang
1Department of Engineering Physics, Tsinghua University, Beijing 100084, China. huangzhifeng@mail.tsinghua.edu.cn
A new large phase-stepping approach for hard X-ray grating imaging simplifies equipment needs. This advancement in grating-based multiple-information imaging technology lowers resolution requirements for wider commercial use.
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