Related Experiment Video
Updated: Jun 11, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Electrostatic diagnostics of nanosecond pulsed electron beams in a Malmberg-Penning trap
1Dipartimento di Fisica and I.N.F.N. Sezione di Milano, Università degli Studi di Milano, Via Celoria 16, 20133 Milano, Italy.
Abstract:
A fast electrostatic diagnostic and analysis scheme on nanosecond pulsed beams in the keV energy range has been developed in the Malmberg-Penning trap ELTRAP. Low-noise electronics has been used for the detection of small induced current signals on the trap electrodes. A discrete wavelet-based procedure has been implemented for data postprocessing. The development of an effective electrostatic diagnostics together with proper data analysis techniques is of general interest in view of deducing the beam properties through comparison of the postprocessed data with the theoretically computed signal shape, which contains beam radius, length, and average density as fit parameters.
Related Concept Videos
Capillary Electrophoresis: Instrumentation
Scanning Electron Microscopy
Fundamental Principles
Accelerated...

