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Updated: Jun 11, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Imaging, core-loss, and low-loss electron-energy-loss spectroscopy mapping in aberration-corrected STEM

Sorin Lazar1, Yang Shao, Lina Gunawan

  • 1Department of Materials Science and Engineering and Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, Canada.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 6, 2010
PubMed

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