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Updated: Jun 10, 2026

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
Published on: January 3, 2016
Intrinsic detection of scattering phase with near-field scanning optical microscope
Dana C Kohlgraf-Owens1, David Haefner, Sergey Sukhov
1CREOL, The College of Optics and Photonics, University of Central Florida, 4000 Central Florida Boulevard, Orlando, Florida 32816, USA.
Abstract:
We show that the interferometric interaction between the tip and the sample is inherently measured by a near-field scanning optical microscope (NSOM) operating in reflection mode. This is demonstrated by measuring the phase of the sample reflectivity on a standard multilayer system with variable thickness. The demonstrated intrinsic sensitivity to the phase has implications in the interpretation of images collected by using reflection mode NSOM.
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