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Published on: December 21, 2010
Separate DNA Pol II- and Pol IV-dependent pathways of stress-induced mutation during double-strand-break repair in
Ryan L Frisch1, Yang Su, P C Thornton
1Department of Molecular and Human Genetics, Baylor College of Medicine,Baylor College of Medicine, Houston, Texas 77030-3411, USA.
Abstract:
Previous work showed that about 85% of stress-induced mutations associated with DNA double-strand break repair in carbon-starved Escherichia coli result from error-prone DNA polymerase IV (Pol IV) (DinB) and that the mutagenesis is controlled by the RpoS stress response, which upregulates dinB. We report that the remaining mutagenesis requires high-fidelity Pol II, and that this component also requires RpoS. The results identify a second DNA polymerase contributing to stress-induced mutagenesis and show that RpoS promotes mutagenesis by more than the simple upregulation of dinB.
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