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Updated: Jun 10, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Selective detection of trace amount of Cu2+ using semiconductor nanoparticles in photoelectrochemical analysis
Guang-Li Wang1, Jing-Juan Xu, Hong-Yuan Chen
1Key Laboratory of Analytical Chemistry for Life Science (Ministry of Education of China), School of Chemistry and Chemical Engineering, Nanjing University, Nanjing, 210093, China.
Abstract:
A highly sensitive and selective photoelectrochemical sensor for Cu(2+) was developed based on the selective interaction between CdS quantum dots (QDs) immobilized on an indium tin oxide (ITO) electrode surface and Cu(2+) in a triethanolamine (TEA) solution to form Cu(x)S-doped CdS QDs, which disrupts the electron transfer from the conduction band of CdS to ITO and results in a decrease of photocurrent.
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