Linear versus non-linear structural information limit in high-resolution transmission electron microscopy

S Van Aert1, J H Chen, D Van Dyck

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. sandra.vanaert@ua.ac.be

Ultramicroscopy
|July 27, 2010
PubMed

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