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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Two-dimensional (2D) microscopy encompasses a range of optical techniques that capture images within a single focal plane, offering detailed representations of microscopic structures. These techniques are essential in biological and medical research, enabling the visualization of cellular and subcellular structures with different levels of contrast and specificity.There are several major types of 2D microscopy, each with strengths and applications.Bright-Field MicroscopyBright-field microscopy...
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Related Experiment Video

Updated: Jun 10, 2026

Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy
09:37

Optimized Negative Staining: a High-throughput Protocol for Examining Small and Asymmetric Protein Structure by Electron Microscopy

Published on: August 15, 2014

Linear versus non-linear structural information limit in high-resolution transmission electron microscopy.

S Van Aert1, J H Chen, D Van Dyck

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. sandra.vanaert@ua.ac.be

Ultramicroscopy
|July 27, 2010
PubMed
Summary

This study introduces new analytical expressions for linear and non-linear information transfer in high-resolution transmission electron microscopy (HRTEM). These expressions, termed structural information limits, account for object structure and improve resolution analysis for advanced microscopes.

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Area of Science:

  • Materials Science
  • Physics
  • Microscopy

Background:

  • The information limit is a key performance metric in high-resolution transmission electron microscopy (HRTEM), traditionally defined by linear transmission of spatial frequencies.
  • Existing methods for measuring the information limit are based on weak phase object approximations, which are inadequate for aberration-corrected microscopes operating at sub-angstrom resolutions.
  • Dynamical scattering from strongly scattering objects becomes significant in advanced HRTEM, influencing the experimental cut-off frequency.

Purpose of the Study:

  • To develop closed-form analytical expressions for quantifying both linear and non-linear information transfer in HRTEM.
  • To introduce the concepts of linear and non-linear structural information limits, explicitly incorporating object structure parameters.
  • To analyze the impact of partial temporal coherence on linear and non-linear imaging terms at high spatial frequencies.

Main Methods:

  • Derivation of analytical expressions for linear and non-linear information transfer.
  • Quantification of cut-off frequencies influenced by both linear and non-linear scattering processes.
  • Analysis of the dependence of information transfer on microscope and object structure parameters.

Main Results:

  • The study provides analytical expressions for linear and non-linear structural information limits.
  • Non-linear information transfer becomes crucial for aberration-corrected HRTEM with strong scattering objects.
  • Partial temporal coherence affects linear and non-linear terms differently, damping non-linear contributions less at high spatial frequencies.

Conclusions:

  • The derived structural information limits offer a more accurate assessment of HRTEM performance, especially for advanced instruments.
  • Understanding non-linear information transfer is essential for achieving ultimate resolution in modern electron microscopy.
  • The findings highlight the importance of considering object structure and non-linear effects when interpreting HRTEM images.