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A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
Published on: September 30, 2019
Precise detection of two-dimensional displacement based on nonlinear lateral photovoltaic effect
1Department of Physics, The State Key Laboratory on Fiber Optic Local Area Communication Networksand Advanced Optical Communication Systems, Key Laboratory for Thin Filmand Microfabrication Technology of the Ministry of Education,Shanghai Jiao Tong University,800 Dongchuan Road Shanghai 200240, China.
This study introduces a novel method for two-dimensional (2D) displacement detection using nonlinear lateral photovoltaic effect (LPE) in metal-semiconductor structures. This approach offers higher precision than traditional one-dimensional methods for advanced photoelectric devices.
Area of Science:
- Optoelectronics
- Semiconductor Physics
- Nanotechnology
Background:
- The lateral photovoltaic effect (LPE) enables precise displacement detection due to its linear photovoltage response.
- Conventional LPE measurements are restricted to one-dimensional (1D) detection between two contacts.
Purpose of the Study:
- To develop a method for two-dimensional (2D) displacement detection using LPE.
- To enhance the precision of displacement measurements beyond 1D limitations.
Main Methods:
- Utilized a nonlinear LPE in a metal-semiconductor (MS) structure.
- Investigated the response of the MS structure to 2D laser displacement.
Main Results:
- Successfully demonstrated 2D displacement detection.
- Achieved significantly higher precision compared to conventional 1D LPE methods.
- The precision was independent of the specific LPV sensitivity of the MS structure.
Conclusions:
- The developed nonlinear LPE method enables precise 2D displacement sensing.
- This technique offers a promising new avenue for advanced MS-based 2D photoelectric devices.
