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Updated: Jun 10, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Trace element analysis of rough diamond by LA-ICP-MS: a case of source discrimination?

Claude Dalpé1, Pierre Hudon, David J Ballantyne

  • 1Royal Canadian Mounted Police, National Police Services, Forensic Science and Identification Services, Materials Profiling, 1200 Vanier Parkway, Ottawa, Ontario K1A 0R2, Canada. claude.dalpe@rcmp-grc.gc.ca

Journal of Forensic Sciences
|August 5, 2010
PubMed

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