Overview of Microscopy Techniques
Atomic Force Microscopy
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Updated: Jun 10, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Seiji Higuchi1, Hiromi Kuramochi, Olivier Laurent
1International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan. higuchi.seiji@nims.go.jp
A new quadruple-scanning-probe tunneling microscope (QSPTM) simplifies nanoscale electrical measurements. This advanced instrument reliably produces four images, making probe positioning easier and reducing accidental contact.
11:33All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
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Published on: June 1, 2016
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