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$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

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Published on: June 19, 2018

RASOR: an advanced instrument for soft x-ray reflectivity and diffraction.

T A W Beale¹, T P A Hase, T Iida

¹Department of Physics, Durham University, South Road, Durham DH1 3LE, United Kingdom.

The Review of Scientific Instruments

|August 7, 2010

Summary

A new soft x-ray diffractometer, RASOR, has been built for single crystal diffraction and thin film reflectivity studies. Initial tests show its potential for advanced materials research at Diamond Light Source.

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Area of Science:

Materials Science
Condensed Matter Physics
X-ray Optics

Background:

Advanced characterization techniques are crucial for understanding material properties.
Soft X-ray diffraction offers unique insights into electronic and magnetic structures.
Existing instrumentation may have limitations in specific experimental regimes.

Purpose of the Study:

To report the design and construction of a novel soft x-ray diffractometer.
To establish a versatile instrument for general user access at Diamond Light Source.
To enable studies in single crystal diffraction and thin film reflectivity.

Main Methods:

Installation of a new instrument, RASOR, at Diamond Light Source.
The diffractometer features a limited three-circle goniometer (theta, 2theta, chi) with a removable phi stage.
Equipped with a liquid helium cryostat and post-scatter polarization analysis for advanced measurements.

Main Results:

Successful design and construction of the RASOR soft x-ray diffractometer.
Demonstration of precise sample positioning and beam alignment capabilities.
Initial test measurements confirm the instrument's functionality and potential.

Conclusions:

The RASOR instrument is a valuable new tool for soft x-ray diffraction studies.
It provides enhanced capabilities for single crystal and thin film analysis.
The instrument is ready for general user access, advancing materials research.