A combined environmental straining specimen holder for high-voltage electron microscopy

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Serial Block-Face Scanning Electron Microscopy (SBEM) for the Study of Dendritic Spines
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Serial Block-Face Scanning Electron Microscopy (SBEM) for the Study of Dendritic Spines

Published on: October 2, 2021

Yoshimasa Takahashi1, Masaki Tanaka, Kenji Higashida

  • 1National Institute of Advanced Industrial Science and Technology (AIST), 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan. yoshim.takahashi@aist.go.jp

Ultramicroscopy
|August 11, 2010
PubMed

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