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Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...

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$Interference and Diffraction$ 02:18

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Updated: Jun 10, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Absolute optical ranging using low coherence interferometry.

B L Danielson, C Y Boisrobert

|August 14, 2010

Summary

This study presents a novel method for precise submicrometer distance measurement using an asymmetric fiber Michelson interferometer. The technique achieves nanometer precision by analyzing frequency domain phase slopes, even with sample dispersion.

Area of Science:

Optical Metrology
Interferometry
Nanotechnology

Background:

Accurate measurement of submicrometer distances is crucial in various scientific and industrial fields.
Traditional interferometric methods can be limited by factors like sample dispersion and data acquisition speed.

Purpose of the Study:

To develop a robust method for measuring submicrometer distances with high precision.
To overcome limitations posed by sample dispersion in interferometric measurements.
To enhance the efficiency of data acquisition and processing in distance measurements.

Main Methods:

Utilizing an asymmetric fiber Michelson interferometer with a Light Emitting Diode (LED) as the radiation source.
Analyzing the phase slope of Fourier components in the frequency domain.

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Last Updated: Jun 10, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

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The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Multimodal Volumetric Retinal Imaging by Oblique Scanning Laser Ophthalmoscopy (oSLO) and Optical Coherence Tomography (OCT)

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Employing time-domain sampling at the Nyquist rate for efficient data handling.

Main Results:

Achieved nanometer-level precision in locating reflections.
Demonstrated effectiveness even in the presence of sample dispersion.
Ensured efficient data acquisition and processing through Nyquist rate sampling.

Conclusions:

The developed method offers a precise and efficient approach for submicrometer distance metrology.
The technique is robust against sample dispersion, expanding its applicability.
Compatibility with Nyquist rate sampling streamlines the measurement process.