IR Spectrometers
Phase Contrast and Differential Interference Contrast Microscopy
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
This study applies two-wavelength double heterodyne interferometry for precise topographic measurements on rough surfaces. The technique enhances system stability and simplifies frequency generation using a specialized laser and grating.
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