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Related Concept Videos

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview01:13

Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview

Attenuated total reflectance (ATR) infrared spectroscopy is a powerful analytical technique used to study the composition of materials. It is widely employed in chemistry, materials science, forensic science, and other fields where sample characterization is required. ATR has several advantages over traditional transmission IR spectroscopy, including the requirement of little to no sample preparation and the ability to analyze a wide range of samples.
The ATR process begins by directing a beam...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Law of Rational Indices01:29

Law of Rational Indices

The Law of rational indices is a fundamental principle in the field of crystallography. According to this law, the intercepts of a crystal face along the crystallographic axes (the three-dimensional axes along which a crystal is measured) can be expressed as either equivalent to the unit intercepts (a, b, c) or simple whole number multiples of them. These multiples are typically denoted as na, n'b, and n''c, where n, n', and n'' are simple whole numbers.To illustrate, consider a crystal with...
Measuring Reaction Rates03:09

Measuring Reaction Rates

Polarimetry finds application in chemical kinetics to measure the concentration and reaction kinetics of optically active substances during a chemical reaction. Optically active substances have the capability of rotating the plane of polarization of linearly polarized light passing through them—a feature called optical rotation. Optical activity is attributed to the molecular structure of substances. Normal monochromatic light is unpolarized and possesses oscillations of the electrical field in...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Related Experiment Video

Updated: Jun 10, 2026

Measuring Spatially- and Directionally-varying Light Scattering from Biological Material
11:57

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Published on: May 20, 2013

Profile measuring method based on reflection characteristics at a critical angle in a right-angle prism.

T Matsumoto, Y Kitagawa, M Adachi

    Applied Optics
    |August 14, 2010
    PubMed
    Summary

    This study introduces a novel profile measurement technique using a right-angle prism and total internal reflection. The method accurately captures 3D surface profiles of rough objects by measuring scattered light angles.

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    Published on: November 21, 2019

    Area of Science:

    • Optics and Photonics
    • Metrology and Measurement Science

    Background:

    • Accurate 3D surface profiling is crucial for various scientific and industrial applications.
    • Existing methods may face limitations with rough surfaces or require complex setups.

    Purpose of the Study:

    • To develop a new, high-accuracy method for 3D profile measurements.
    • To utilize optical principles, specifically total internal reflection, for distance determination.

    Main Methods:

    • A right-angle prism is employed to measure surface distance via triangulation.
    • The method relies on changes in the critical angle of total internal reflection.
    • A scanning laser beam illuminates the object, and scattered light angles are measured.

    Main Results:

    • The proposed method enables accurate distance measurements to object surfaces.
    • It successfully captures three-dimensional profiles of objects with rough surfaces.
    • High accuracy in profile measurements is achieved.

    Conclusions:

    • The right-angle prism method offers a robust solution for 3D surface profiling.
    • This technique provides a valuable tool for metrology, particularly for challenging surfaces.